Browsing by Author "Meehan, David E."
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Combined scanning tunneling microscopy (STM) & surface stress measurements (SSM) of chemical reactions on semiconductor surfaces : oxidation of the Si(111)-(7x7)surface
Meehan, David E. (Trinity College (Dublin, Ireland). School of Chemistry, 2012)A novel combined scanning tunneling microscopy (STM) and surface stress measurement (SSM) system has been developed to allow absorbate-induced changes in surface stress to be measured and related to the structural and ...