Now showing items 1-2 of 2

    • Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM 

      Jones, Lewys (2021)
      When characterising beam-sensitive materials in the scanning transmission electron microscope (STEM), low- dose techniques are essential for the reliable observation of samples in their true state. A simple route to minimise ...
    • New Technologies for Ultra-low Dose-rate Imaging in the STEM 

      Mullarkey, Tiarnan (Trinity College Dublin. School of Physics. Discipline of Physics, 2023)
      Electron microscopy arose from the need to image materials beyond the resolution optical microscopes could achieve. Though taking many years and technological advancements, the modern scanning transmission electron microscope ...