"Modelling of Atomic Imaging and Evaporation in the field Ion Microscope"
Citation:
Keith J. Fraser and John J. Boland, Modelling of Atomic Imaging and Evaporation in the field Ion Microscope , Journal of Sensors, 2012, 2012, 2011, 1 - 8Download Item:
Abstract:
Imaging and evaporation of atoms in the field ion microscope (FIM) has been modelled by using finite difference methods to
calculate the voltage distribution around a tip and hence the electric field strength experienced by individual atoms. Atoms are
evaporated based on field strength using a number of different mathematical models which yield broadly similar results. The tip
shapes and simulated FIM images produced show strong agreement with experimental results for tips of the same orientation and
crystal structure. Calculations have also been made to estimate the effects on resolution of using a field-sharpened tip for scanning
probe microscopy.
Sponsor
Grant Number
Science Foundation Ireland (SFI)
Grant no. 06/IN.1/I106
European Union (EU)
Contract no. 214250
Author's Homepage:
http://people.tcd.ie/jbolandDescription:
PUBLISHED
Author: BOLAND, JOHN
Type of material:
Journal ArticleCollections
Series/Report no:
Journal of Sensors2012
2012
Availability:
Full text availableKeywords:
Nanoscience, NanotechnologySubject (TCD):
Nanoscience & MaterialsDOI:
http://dx.doi.org/10.1155/2012/961239Metadata
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