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dc.contributor.advisorWilson, Simon
dc.contributor.authorAslett, Louis J.M.
dc.date.accessioned2016-10-27T11:44:02Z
dc.date.available2016-10-27T11:44:02Z
dc.date.issued2012
dc.identifier.citationLouis J.M. Aslett, 'MCMC for inference on phase-type and masked system lifetime models', [thesis], Trinity College (Dublin, Ireland). School of Computer Science & Statistics, 2012, pp 191
dc.identifier.otherTHESIS 10005
dc.identifier.urihttp://hdl.handle.net/2262/77559
dc.description.abstractCommon reliability data consist of lifetimes (of censoring information) on all components and systems under examination. However, masked system lifetime data represents an important class of problems where the information available for statistical analysis is more limited: one only has failure times for the system as a whole, but no data on the component lifetimes directly, or even which components had failed. For example, such data can arise when system autopsy is impractical or cost prohibitive.
dc.format1 volume
dc.language.isoen
dc.publisherTrinity College (Dublin, Ireland). School of Computer Science & Statistics
dc.relation.isversionofhttp://stella.catalogue.tcd.ie/iii/encore/record/C__Rb15349366
dc.subjectComputer Science & Statistics, Ph.D.
dc.subjectPh.D. Trinity College Dublin
dc.titleMCMC for inference on phase-type and masked system lifetime models
dc.typethesis
dc.type.supercollectionthesis_dissertations
dc.type.supercollectionrefereed_publications
dc.type.qualificationlevelDoctoral
dc.type.qualificationnameDoctor of Philosophy (Ph.D.)
dc.rights.ecaccessrightsopenAccess
dc.format.extentpaginationpp 191
dc.description.noteTARA (Trinity’s Access to Research Archive) has a robust takedown policy. Please contact us if you have any concerns: rssadmin@tcd.ie


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