Conductance probe microscopy investigation on the local electronic properties of single walled carbon nanotube systems
Citation:
Peter Niraj Nirmalraj, 'Conductance probe microscopy investigation on the local electronic properties of single walled carbon nanotube systems', [thesis], Trinity College (Dublin, Ireland). School of Chemistry, 2010, pp 137Download Item:
Abstract:
In order to build electronic devices and circuits comprised of nanoscale materials as the active element it is imperative to unravel the local electronic properties of these
materials. We have performed an in-depth study on the local electronic behavior of
individual single walled carbon nanotubes (SWCNT) and on two dimensional networks
based on these tubes using conductance imaging atomic force microscopy (CI-AFM).
This technique allows us to simultaneously investigate the morphology and the local
electronic structure of the nanotubes, when a metal coated tip is scanned over the
surface. SWCNTs solubilised in N-methyl pyrrolidone (NMP) were sprayed onto Si02
substrates to form homogeneous and percolating networks. The electrodes were
fabricated using UV-lithographically and these samples were subjected to controlled
annealing at 500 degrees Celsius under Ar/H2 atmosphere to remove the adsorbed NMP
molecules.
Author: Nirmalraj, Peter Niraj
Advisor:
Boland, JohnQualification name:
Doctor of Philosophy (Ph.D.)Publisher:
Trinity College (Dublin, Ireland). School of ChemistryNote:
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Full text availableKeywords:
Chemistry, Ph.D., Ph.D. Trinity College Dublin.Metadata
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