dc.contributor.author | Jones, Lewys | |
dc.date.accessioned | 2022-03-07T14:03:42Z | |
dc.date.available | 2022-03-07T14:03:42Z | |
dc.date.issued | 2021 | |
dc.date.submitted | 2021 | en |
dc.identifier.citation | Mullarkey, T. and Downing, C. and Jones, L., Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM, Microscopy and Microanalysis, 2021, 99 - 108 | en |
dc.identifier.other | Y | |
dc.identifier.uri | http://hdl.handle.net/2262/98242 | |
dc.description.abstract | When characterising beam-sensitive materials in the scanning transmission electron microscope (STEM), low-
dose techniques are essential for the reliable observation of samples in their true state. A simple route to
minimise both the total electron-dose and the dose-rate is to reduce the electron beam-current and/or raster the
probe at higher speeds. At the limit of these settings, and with current detectors, the resulting images suffer
from unacceptable artefacts including; signal-streaking, detector-afterglow, and poor signal-to-noise ratios
(SNR). In this manuscript we present an alternative approach to capture dark-field STEM images by pulse-
counting individual electrons as they are scattered to the annular dark-field (ADF) detector. Digital images
formed in this way are immune from analogue artefacts of streaking or afterglow and allow clean, high-SNR
images to be obtained even at low beam-currents. We present results from both a ThermoFisher FEI Titan G2
operated at 300kV and a Nion UltraSTEM200 operated at 200kV, and compare the images to conventional
analogue recordings. ADF data are compared with analogue counterparts for each instrument, a digital
detector-response scan is performed on the Titan, and the overall rastering efficiency is evaluated for various
scanning parameters. | en |
dc.format.extent | 99 - 108 | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | Microscopy and Microanalysis; | |
dc.rights | Y | en |
dc.subject | beams | en |
dc.subject | scanning transmission electron microscopy | en |
dc.subject | low-dose imaging | en |
dc.subject | Scanning transmission electron microscopy | en |
dc.subject | Low-dose imaging | en |
dc.subject | Electron counting | en |
dc.subject | Annular dark-field (ADF) imaging | en |
dc.title | Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM | en |
dc.type | Journal Article | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/jonesl1 | |
dc.identifier.rssinternalid | 224344 | |
dc.identifier.doi | http://dx.doi.org/10.1017/S1431927620024721 | |
dc.rights.ecaccessrights | openAccess | |
dc.identifier.orcid_id | 0000-0002-6907-0731 | |