Novel system development for combined scanning tunneling microscopy & surface stress measurements to investigate the origins of surface forces
Citation:
Niall T. Kinahan, 'Novel system development for combined scanning tunneling microscopy & surface stress measurements to investigate the origins of surface forces', [thesis], Trinity College (Dublin, Ireland). School of Chemistry, 2009, pp 267Download Item:
Abstract:
The oxidation of the silicon surface has been widely studied due to its vast
scientific and technological importance. However, despite extensive work on the topic the
exact details of the oxidation reaction still remain a contentious issue. It has been
proposed that surface stress measurements may prove useful in elucidating this and
related issues. In the case of adsorption on solid-state surfaces, induced surface stresses
arise primarily from differences in atomic size and electronegativity, in addition to
changes in surface morphology and defect formation.
Author: Kinahan, Niall T.
Advisor:
Boland, JohnQualification name:
Doctor of Philosophy (Ph.D.)Publisher:
Trinity College (Dublin, Ireland). School of ChemistryNote:
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Chemistry, Ph.D., Ph.D. Trinity College Dublin.Metadata
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